Hitachi UH4150 UV-VIS/NIR Spectrophotometer

The Hitachi UH4150 UV-Vis/NIR Spectrophotometer is a high-performance analytical instrument designed for advanced optical measurements of solid materials and coated surfaces. Covering an extensive wavelength range of 240–2600 nm, the UH4150 provides exceptional flexibility for reflectance, transmittance, and optical characterization across the ultraviolet, visible, and near-infrared regions.

This spectrophotometer is particularly suited for the evaluation and quality control of optical components, enabling precise and non-destructive analysis of materials such as lenses, coated glass, wafers, and thin films. The UH4150 can be configured with a range of specialized accessories to support diverse analytical workflows in materials science, semiconductor research, photovoltaics, and industrial quality control.

The system incorporates a high-precision prism/grating monochromator with an infinitely variable slit and advanced detection options, delivering accurate spectral measurements with excellent optical performance. With support for both direct light detection and integrating sphere detection systems, the instrument can analyze samples with varying optical properties, including highly reflective or scattering materials.

For coated glass and similar materials, the UH4150 supports variable-angle absolute reflectance measurements. Using a dedicated accessory capable of 20° to 60° incident angle adjustment, the system measures both absolute reflectance and transmittance by independently rotating the detector and sample stage. This feature is particularly valuable in optical coating analysis, solar cell development, and advanced materials research.

With its large sample handling capacity and versatile measurement accessories, the UH4150 provides laboratories with a powerful platform for precision optical analysis and materials characterization.

Key Features

• Wide wavelength range: 240 – 2600 nm (UV-Vis-NIR)
• Designed for solid sample optical characterization
• Supports reflectance and transmittance measurements
• Non-destructive measurement capability with specialized accessories
• Prism/grating monochromator with infinitely variable slit
• Compatible with direct detection or integrating sphere detection systems
• Supports variable-angle reflectance measurements (20°–60°)
• Large sample stage suitable for optical components and coated surfaces
• Ideal for research, materials analysis, and industrial quality control

Applications

The Hitachi UH4150 is suitable for advanced optical and materials analysis, including:

• Optical component testing
• Optical thin film characterization
• Lens transmission measurement
• Semiconductor wafer reflectance and transmission
• Solar cell and photovoltaic material evaluation
• Coated glass and architectural glass analysis
• Micro-sample reflectance measurements
• Materials science and nanotechnology research
• Industrial optical quality control

Technical Specifications

Available Models

The Hitachi UH4150 UV-Vis/NIR Spectrophotometer provides high-precision optical analysis across a wide spectral range, making it an ideal instrument for materials research, semiconductor analysis, photovoltaic evaluation, and optical coating quality control. Its flexible accessory options and advanced detection systems allow laboratories to perform accurate, non-destructive measurements of complex solid samples.